DETERMINING PLANT RATINGS WITHOUT FIELD TRIALS 11 -- EVALUATION AND PREDICTION OF CLONAL SMUT RESISTANCE STATUS BY MORPHOLOGICAL AND SPECTROSCOPIC EXAMINATIONS OF SUGARCANE BUD SCALE SURFACES
By J.H. CHURCHILL, B.J. CROFT, S. KOKOT, M.G. O'SHEA
BREEDING for increased smut resistance has become a high priority for the
Australian sugar industry since the recent incursion of the disease into the Ord
River Irrigation Area. Traditional screening processes are impossible in
Queensland due to quarantine restrictions. Hence, potential clones are evaluated
in Indonesia at considerable expense. As an alternative, the examination of bud
scale surfaces both by conventional and spectroscopic means would be an
attractive alternative to the traditional methods. It was hypothesised that there
would be observable differences between sugarcane bud surfaces of resistant and
susceptible clones, since the buds were the site of infection by the smut fungal
pathogen. Scanning electron microscopy (SEM) examination of bud surfaces has
uncovered a relationship between resistance status and the degree of coverage of
the overall bud by the outermost bud scales. This is presently a qualitative
difference between clones of a particular resistance status. However, a more
quantitative result was developed using near infrared (NIR) techniques to probe
bud surfaces. Initial results suggest that we can predict clonal ratings using
partial least squares techniques based purely on NIR spectral data obtained from
the bud surface. These techniques may develop into alternative marker systems
enabling more rapid discrimination between resistant and susceptible clones
within a sugarcane plant breeding program.